Each year, 33 million people worldwide suffer a stroke, 20% of which are caused by Non Valvular Atrial Fibrillation (NVAF), a life-threatening heart rhythm disease. In AF, blood clots are formed in the LAA, a small sac in the wall of the left atrium of the heart. 90% of strokes in NVAF patients are caused by migration of these clots to the brain.
Due to the LAA’s complex structure, it is difficult to close it completely by the current marketed devices and blood clots can still leak to the brain. Another risk of these devices is the potential formation of device-related thromboembolism because of foreign material implants that are left in the heart. The implantation procedure is complicated.
Next Generation Left Atrial Appendage Elimination System
CT SCAN 3 DAYS POST IN-VIVO CHRONIC PROCEDURENULL
INVAGINATED SEALED LAA
CT SCAN 146 DAYS POST IN-VIVO CHRONIC PROCEDURE
Leave no metal implant
in the heart
Achieve complete sealing
of the LAA opening
Simplify the procedure
Team Leader, Mechanical Engineer
CSO & Founder
Inventor & Advisor
Chairman of the SAB